The Averna Iridium PLTS supports the following test cases with in-band and wide-band options.* See also Supported Iridium Production Tests below.
|Test Case||Description||In-Band||Wide Band|
|BER||% BER at a variable input level (dBm)||✓||✓|
|BER 2% Sensitivity||Determines input level (dBm) required for 2% BER||✓||✓|
|BER with Interference||BER with alternate and adjacent interference||✓|
|Receiver Blocking||Receiver spurious rejection and blocking||✓|
|RSSI||Returns UUT RSSI per input level (dBm)||✓||✓|
|FER||Determines % FER based upon frames with failed synchronization to downlink||✓||✓|
|Modulation Accuracy (EVM)||Measures peak and RMS EVM between 0.5 and 10%||✓||✓|
|Tx Power||Tx power in dBm||✓||✓|
|Burst Ramp Time||Measurements for ramp time and fall time in uS||✓||✓|
|ACCP||Measures adjacent channel power in adjacent and alternate channels over specified bandwidth (43.33 kHz)||✓||✓|
|Narrow Band Spectral Mask||Applies narrowband spectral mask measurements for Iridium transceivers within 1 MHz of desired channel||✓||✓|
|PRE-COMPLIANCE Wideband Spurious Emissions||Measures emissions up to 3 GHz and applies appropriate regulatory limits||✓|
* Based on 20 MHz band centered at 1621 MHz, 41.6667 KHz channel bandwidth, and 8.28mS Tx burst in 90 mS frame.
Our 9603/9603N Iridium production test system supports the following:
Iridium labs, product designers and equipment makers use our Iridium solutions to speed up design verification, verify device performance and get their products to market faster.