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Features & Benefits | Test Coverage
The Averna Iridium PLTS supports the following test cases with in-band and wide-band options.* See also Supported Iridium Production Tests below.
| Test Case | Description | In-Band | Wide Band |
|---|---|---|---|
| BER | % BER at a variable input level (dBm) | ✓ | ✓ |
| BER 2% Sensitivity | Determines input level (dBm) required for 2% BER | ✓ | ✓ |
| BER with Interference | BER with alternate and adjacent interference | ✓ | |
| Receiver Blocking | Receiver spurious rejection and blocking | ✓ | |
| RSSI | Returns UUT RSSI per input level (dBm) | ✓ | ✓ |
| FER | Determines % FER based upon frames with failed synchronization to downlink | ✓ | ✓ |
| Modulation Accuracy (EVM) | Measures peak and RMS EVM between 0.5 and 10% | ✓ | ✓ |
| Tx Power | Tx power in dBm | ✓ | ✓ |
| Burst Ramp Time | Measurements for ramp time and fall time in uS | ✓ | ✓ |
| ACCP | Measures adjacent channel power in adjacent and alternate channels over specified bandwidth (43.33 kHz) | ✓ | ✓ |
| Narrow Band Spectral Mask | Applies narrowband spectral mask measurements for Iridium transceivers within 1 MHz of desired channel | ✓ | ✓ |
| PRE-COMPLIANCE Wideband Spurious Emissions | Measures emissions up to 3 GHz and applies appropriate regulatory limits | ✓ |
* Based on 20 MHz band centered at 1621 MHz, 41.6667 KHz channel bandwidth, and 8.28mS Tx burst in 90 mS frame.
Our 9603/9603N Iridium production test system supports the following:
Iridium labs, product designers and equipment makers use our Iridium solutions to speed up design verification, verify device performance and get their products to market faster.