Support
    • Smart ManufacturingSmart manufacturing solutions that connect test systems, data, and automation to enable real-time visibility and predictive insights.
    • Prototyping & ConsultingEarly-stage Design for Testability (DFT) analysis, flexible prototyping, and proof-of-concept validation.
    • Automated Test Solutions (ATE)High-speed benchtop and cabinet-level verification, validation and testing.
    • In-Line Test SystemsContinuous conveyor line automated test or inspection with zero-cycle interruption.
    • Precision Assembly & ProductionAutomated assembly solutions with advanced robotics, inspection, and process control for zero-defect manufacturing.
    • Test System ReplicationGlobal multi-site deployment of identical test systems with obsolescence control.

    Bring Your Quality to the Next Level.

    Explore scalable quality solutions engineered for the world’s most demanding high-reliability products and automated manufacturing environments.

    Talk to an expert
    Engineers manipulating an ATEC ATMOS test station

    Our flexible test platforms are built on proven architectures with integrated IP, enabling maximum reuse and faster deployment for product design, manufacturing and support.

    Find the right platform for your application
    Explore all RF instruments
    Explore all software solutions
    Knowledge & Engineering

    Visit our Resource Center for videos, white papers, brochures & eBooks

    Resource Center
    • About usAverna Powered by Spherea is recognized as a worldwide Test & Quality Engineering leader, delivering innovative, end-to-end solutions that accelerate time-to-market and ensure flawless performance.
    • Technology PartnersTo ensure we provide the best possible solutions and integration services to our customers, we are strategically aligned with the world’s top test and technology companies.
    • ESG & SustainabilityWe are more committed than ever to honor our role as an employer, supplier, and customer by contributing positively to our communities.
    • CareersJoin our team full of incredible talent and inspire the future of test. Our people are who make us who we are and we demonstrate this through our values everyday!

    Bring Test to the Next Level

    Our team of 1800 specialists are passionate about delivering engineering innovation, zero-defect quality architectures, and mission-critical automated testing systems across the product lifecycle.

    60+ YearsTest Experience
    20,000+Completed Projects
    Download our Corporate Profile

    Features & Benefits | Test Coverage

    Iridium Test Coverage and Supported Test Cases

    The Averna Iridium PLTS supports the following test cases with in-band and wide-band options.* See also Supported Iridium Production Tests below.

    Test Case Description In-Band Wide Band
    BER % BER at a variable input level (dBm) ✓ ✓
    BER 2% Sensitivity Determines input level (dBm) required for 2% BER ✓ ✓
    BER with Interference BER with alternate and adjacent interference   ✓
    Receiver Blocking Receiver spurious rejection and blocking   ✓
    RSSI Returns UUT RSSI per input level (dBm) ✓ ✓
    FER Determines % FER based upon frames with failed synchronization to downlink ✓ ✓
    Modulation Accuracy (EVM) Measures peak and RMS EVM between 0.5 and 10% ✓ ✓
    Tx Power Tx power in dBm ✓ ✓
    Burst Ramp Time Measurements for ramp time and fall time in uS ✓ ✓
    ACCP Measures adjacent channel power in adjacent and alternate channels over specified bandwidth (43.33 kHz) ✓ ✓
    Narrow Band Spectral Mask Applies narrowband spectral mask measurements for Iridium transceivers within 1 MHz of desired channel ✓ ✓
    PRE-COMPLIANCE Wideband Spurious Emissions Measures emissions up to 3 GHz and applies appropriate regulatory limits   ✓

    * Based on 20 MHz band centered at 1621 MHz, 41.6667 KHz channel bandwidth, and 8.28mS Tx burst in 90 mS frame.

    Supported Iridium Production Tests

    Our 9603/9603N Iridium production test system supports the following:Averna's Iridium Physical Layer Test System for Production (PLTS)

    • Firmware check
    • Baseband UART digital tests
    • RX calibration
    • RX bandwidth measurements
    • RX noise-floor measurements
    • BER
    • Transmitter current
    • TX closed-loop RF power tuning
    • TX ACCP
    • TX EVM
    • GPS pass-through
    LEARN MORE TODAY

    Iridium labs, product designers and equipment makers use our Iridium solutions to speed up design verification, verify device performance and get their products to market faster.