DNA Series Phase Noise Analyzer Ultra‑Low Noise & Frequency Stability

DNA Series

High-performance phase noise and frequency stability analyzer for advanced R&D, aerospace, defense, and metrology applications.

Ultra-low noise measurements down to thermal limits

Immune to the collapse of the cross-correlation

No phase lock requirement simplifies setup and operation

Supports cross-frequency measurements between device under test (DUT) and reference

Fast, single-touch measurement with results in seconds

Product Description

The DNA Series is a high-performance phase noise and frequency stability analyzer designed for advanced research and development applications. Its unique digital architecture enables extremely low noise measurements without the need for complex phase-locked loops. This allows for faster setup, reduced measurement errors, and improved reliability.

The system supports flexible configurations, with models covering frequency ranges from 2 MHz to 400 MHz. It can operate with internal or external references and even allows measurements between signals at different frequencies, offering unmatched versatility.

Key Benefits

Simplified measurement setup with no phase locking required
Reduced measurement errors and higher accuracy
Faster results with automated acquisition
Flexible configurations for a wide range of test scenarios
Modular versions with internal or external reference options

High-precision SSB phase noise analysis (dBc/Hz)
Accurate detection and characterization of spurious signals
Reliable measurement across a wide range of signal conditions

Comprehensive frequency stability evaluation over time
Supports overlapped and cross-variance methods
Enables detailed insight into long-term signal behavior, up to 106 second

Reduces measurement noise to reveal true DUT performance
Supports millions of averages for ultra-low noise floors
Improves accuracy for advanced R&D applications

Covers both close-in and far-from-carrier noise analysis
Flexible configuration across multiple decades
Ideal for diverse oscillator and signal source testing

Export measurement data in standard formats (e.g. CSV)
Enables further processing and custom reporting

RF IN connector	Type-N Female, 50 ohms nominal
RF IN frequency range	2 MHz to 100 MHz (DNA 100) 2 MHz to 400 MHz (DNA 400)
RF IN measurement level	-10 dBm to +20 dBm
Input damage level	AC > +23dBm, 0V DC max
Standards supported	Lorem ipsum dolor sit amet

RF IN frequency range	2 MHz to 100 MHz (DNA 100) 2 MHz to 400 MHz (DNA 400
Measurement parameters	SSB noise (dBc/Hz), Spurious (dBc), Allan & overlapped Allan Variance, Hadamard & overlapped Hadamard variance. Fractional frequency noise chronogram.
Number of traces	20 data traces for SSB phase noise and frequency stability.
Number of markers	20
Offset frequency range	1 mHz to 1 MHz, 10 MHz typical
Phase Noise accuracy	+/- 2 dB (+/- 1 dB typical)
SSb noise sensitivity Typical residual phase noise	See table for complete values
15mmin measurement 10MHz	-137dBc/Hz@1Hz -190dBc/Hz@1MHz -121dBc/Hz@1Hz -194dBc/Hz@10MHz
Enhanced sensitivity	Fully continuous cross-correlation method up to millions of averages
Frequency Reference	L version: external sources (single or dual) F version: internal or external sources (single or dual)
Residual Allan deviation (5MHz to400 MHz)	< 7E-14 (5Hz ENBW) < 5E-16 (5Hz ENBW)
Possibility of up to 1,000,000s	(Cross variance could typically improve by a factor of 10)
Residual spurious response level(measurement engine), excludingAC power related spurs	-50 dBc at 1 Hz offset -70 dBc at 10 Hz offset -90 dBc at 100 Hz offset <-110 dBc above 1kHz offset
Spurious detection Algorithm	Adjustable Peak detection based on noise statistical information
Measurement time	see timetable
Resolution Bandwidth	Variable settings in each independent decade based on 1024 FFTs in a cascaded continuous noise decimation chain
Internal Source output power (FVersion only)	+10 dBm +/- 3 dB