SHOWS & SEMINARS

2016

National Instruments’ Annual Graphical System Design Conference and Exhibition


August 1–4, 2016

 

Meet Averna in Austin!

Drop by Booth #310 and let us know how we can help solve your challenges. NIWeek2016

We’re an NI Platinum Alliance Partner and the 2015 winner of the Platinum Outstanding Technical Resources Award. We’ll have a sizeable contingent of NI experts on site to discuss innovative test, measurement and product-quality solutions, including integration of PXI modules, software (LabVIEW/FPGA, TestStand, etc.), material handling/robotics and automation, as well as machine vision/inspection systems, test station replication and global support services.

Live Demos

Averna Signal Tester (AST-1000) – All-in-One RF Signal Source

Our brand-new AST-1000 is powered by Averna’s RF signal expertise and the NI VST. This all-in-one functional test solution is ideal for testing all common RF signals such as AM/FM, DAB, GPS, HD Radio, and Sirius/XM. Highly extensible, it can also record and play real-world RF.

PIM Analyzer – For Measuring and Eliminating Passive Intermodulation
The cost-effective, PXIe-based PIM Analyzer is ideal for production testing of radio base-station filters, couplers, antennas and more. It covers a 500–2500 MHz frequency band, takes 100+ measurements per second (e.g., PIM vs time) and includes LabVIEW FPGA-driven data generation/analysis.

Event Details

When: August 1-4, 2016 (Exhibit Hall – August 1-3)

Where: Austin Convention Center, 500 E Cesar Chavez St., Austin, TX 78701. Get directions.

Contact: To arrange a meeting with Averna at the show, please contact Myriam Duchaine.

Visit the event’s website for more information.
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