National Instruments Technical Symposium: Dallas
October 05, 2010
Hyatt Regency North DallasDallas, TX, USA
NI Technical Symposium is a series of free, full-day conferences exploring the latest trends in automation, design, and test. With an open agenda format featuring keynotes from NI experts, a variety of technical sessions, hands-on labs, and presentations, the conference offers information on emerging industry trends within a valuable networking forum and product exhibition.
Attend our presentation to discover real customer use cases and concrete results:
Modular Approach to Channel Emulation
This presentation deals with developing better and more cost-effective products to effectively test wireless devices that may compete for same bandwidth, while considering the extreme signal impairments encountered in their operating environments. Averna used National Instruments RF and FPGA products to build a channel emulator that simulates real-world atmospheric impairments characteristic of a wireless channel. This device can be used in the design and validation phases of a product to ensure that it will operate in today’s crowded radio frequency environment.
Live demo
See the URT Signal Generator in action. Test engineers use it to simulate all typical signal impairments for lab analysis, from design validation to production, reducing the need for field test and improving efficiency of the development cycle.
Contact us today to schedule a meeting during this Technical Symposium. Obtain the resources you need to tackle your next test, validation, or automation challenge
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