Shows and Seminars

Test Strategy Seminar

October 12, 2010

Holiday Inn Pointe Claire
Montreal, Quebec, Canada

Come join Averna, National Instruments, Telefunken Semiconductor, JTAG Technologies and Esterline-CMC Electronics on this one day event to explore the latest techniques in Pre-functional and Functional Tests. What you must know before embarking on a specific test strategy, why and how.

Who should attend: Anyone involved with Test Engineering and needs to take into account on how to test a product with complete coverage and controlled costs
What you will learn: Different techniques used in the industry that enable companies augment their test engineering skill set to avoid costly returns and reduce dissatisfied customers
Cost: Free (limited space available)

Program
8:30 - 9:00 — Registration. Muffins and coffee will be served 9:00 - 10:15 — JTAG Technologies: Design for testability, by Anthony Sparks 10:30 - 11:30 — Telefunken Semiconductor: System-level boundary-scan, by Ken Filliter 12:00 - 12:45 — Lunch (complimentary) 1:00 - 2:00 — National Instruments: NI TestStand as a standard, by Denys Tison 2:15 - 3:15 — Averna: Best Practices for Functional Test, by Gabriel Marechal 3:30 - 4:00 — Esterline CMC Electronics: Level Boundary Scan: Strategies, implementation and benefit, by Jean-Yves Bourque

Program

8:30 - 9:00 — Registration. Muffins and coffee will be served
9:00 - 10:15 — JTAG Technologies: Design for testability, by Anthony Sparks
10:30 - 11:30 — Telefunken Semiconductor: System-level boundary-scan, by Ken Filliter
12:00 - 12:45 — Lunch (complimentary)
1:00 - 2:00 — National Instruments: NI TestStand as a standard, by Denys Tison
2:15 - 3:15 — Averna: Best Practices for Functional Test, by Gabriel Marechal
3:30 - 4:00 — Esterline CMC Electronics: Level Boundary Scan: Strategies, implementation and benefit, by Jean-Yves Bourque

Visit the Event site.