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Averna’s BTE solution optimizes data relay testing for Rheinmetall
Challenges
  • A mission-critical BTE solution that could run on multiple UUTs in parallel, testing the programming shelf as a whole or the individual circuit cards composing the shelf
  • A mobile solution that integrates fully with existing systems
  • Easy to use for all crew and maintenance personnel
  • A mobile solution that integrates fully with existing systems
Products Used
NI PCI hardware, LabVIEW, NI TestStand
Results
Averna created and delivered a mission-critical, compact MDS BTE solution that empowers an industry-leading manufacturer to run functional testing on its data relay and display systems. The solution was delivered on time and within budget, and has been proven to be robust and dynamic, meeting and exceeding system requirements. Courtesy of Averna’s engineering innovation, the customer has maximized their test investment and has accelerated product time-to-quality.