Burn-in & Life-test, and Qualification Systems

Averna's Burn-in & Life-test, and Qualification systems are composed of tightly-controlled temperature environments that can perform component testing either on a continuous basis, or at the end of the burn-in period.

With high device counts in compact chambers, you will be able to increase throughput and make your test activities more efficient. Devices can be tested when either packaged or in chip-on-carrier form.

For more information, we encourage you to visit Yelo.co.uk, a site dedicated to supporting this product.