NIWeek 2014 – Worldwide Graphical System Design Conference
August 4, 2014 - August 7, 2014Austin Convention Center, Booth #304
Austin, Texas, USA
We look forward to meeting you in Austin!
Drop by Booth #304 and let us know how we can help solve your test challenges.
We’re an NI Platinum Alliance Partner and will have a sizeable contingent of test engineering and NI solutions experts on site to discuss attendees’ hardware, software, integration, application and automation projects.
And here are just some of the many activities that we will be involved in:
Live Demos: Compact Test Station
Great things come in small packages and this flexible, all-in-one Averna tester is certainly proof of that. Check out our brand-new compact test solution, which includes high-performance PXI modules, a URT-5000 Signal Generator for RF test & measurement, automated test software, a VPC mass interconnect, a barcode scanner, and much more.
Don’t miss the following Averna sessions (dates and times TBA):
- Implementing Gang of Four Design Patterns in LabVIEW (TS3427).
- Optimizing Manufacturing Throughput for RF Power Amplifiers (TS3428).
- Accelerating Automotive Radar Testing With NI Tools and Robotics (TS4796).
- From the Experts: Automated Test Best Practices (TS4458).
Various client lunches, cocktails, dinners and after-hours parties.
When: August 4-7, 2014
Where: Austin Convention Center, 500 E Cesar Chavez St., Austin, TX 78701. Get directions.
Contact: To arrange a meeting with Averna at the show, please contact Myriam Duchaine.